International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | Mr Jim Lynch | CDIS | 2013-05 | 2017 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||||
|---|---|---|---|---|---|---|---|---|---|---|
| AMW |
| 2011-05-06 | ||||||||
| CCDV |
| 2011-07-07 | 2011-07-31 | |||||||
| ADIS |
| 2012-04-10 | 2012-03-15 | |||||||
| DEC | 2012-11-02 | 2012-07-31 | ||||||||
| RDIS | 2012-11-12 | 2012-11-30 | ||||||||
| CDIS |
| 2013-01-17 | 2013-02-15 | |||||||
| APUB | 2013-03-31 | |||||||||
| BPUB | 2013-04-15 | |||||||||
| PPUB | 2013-05-15 | |||||||||
201 kB
150 kBProject
IEC 60749-26 Ed. 3.0
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
Remark:
Project plan - FDIS: 2011-12 IS: 2012-04