International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
SC 47E |
Dispositifs discrets à semiconducteurs |
Détail
Comité | Groupes de Travail | Chef de Projet | Statut Courant | Frcst Pub Date | Date Stabilité |
|---|---|---|---|---|---|
| SC 47E | 03 | Shuuji MIYASHITA | PPUB | 2010-12 | 2015 |
Historique
Stage | Document | Downloads | Date de Décision | Date Cible | ||||
|---|---|---|---|---|---|---|---|---|
| AMW |
| 2003-12-26 | ||||||
| AMW |
| 2004-01-23 | ||||||
| PWI | 2005-06-10 | 2004-08-31 | ||||||
| AMW |
| 2006-09-22 | ||||||
| 1CD |
| 2007-01-26 | 2006-12-31 | |||||
| CDM |
| 2007-10-05 | 2007-06-15 | |||||
| ACDV |
| 2008-05-09 | 2008-02-29 | |||||
| CCDV |
| 2008-05-16 | 2008-05-31 | |||||
| ADIS |
| 2009-08-21 | 2009-01-31 | |||||
| DEC | 2010-06-18 | 2010-06-30 | ||||||
| RDIS | 2010-06-30 | 2010-07-15 | ||||||
| CDIS |
| 2010-09-10 | 2010-09-30 | |||||
| APUB |
| 2010-11-22 | 2010-11-15 | |||||
| BPUB | 2010-11-23 | 2010-11-30 | ||||||
| PPUB | 2010-12-15 | 2010-12-31 | ||||||
69 kBProjet
IEC 60747-8 Ed. 3.0
Dispositifs à semiconducteurs - Dispositifs descrets - Partie 8: Transistors à effet de champ
Remarque:
- DEC: 2010-06 (see SMB/4070/DL) - Targets - CDV: 2007-05 FDIS: 2007-11 cc. TC 22
Document Associés:
SMB/3062/DL