International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Dispositifs à semiconducteurs |
Détail
Comité | Groupes de Travail | Chef de Projet | Statut Courant | Frcst Pub Date | Date Stabilité |
|---|---|---|---|---|---|
| TC 47 | 06 | Dr. B. N. Lee | ACDV | 2014-12 |
Historique
Stage | Document | Downloads | Date de Décision | Date Cible | ||
|---|---|---|---|---|---|---|
| PNW |
| 2011-08-05 | ||||
| PNW |
| 2011-08-05 | ||||
| ANW |
| 2012-01-03 | 2011-12-31 | |||
| ANW |
| 2012-01-03 | 2011-12-31 | |||
| 1CD |
| 2012-10-02 | 2012-06-30 | |||
| ACDV |
| 2013-02-22 | 2013-02-28 | |||
| 1CD | 2012-06-30 | |||||
| CCDV | 2013-08-31 | |||||
439 kBProjet
IEC 62779-1 Ed. 1.0
Remarque:
Project plan - CDV: 2013-06, FDIS: 2014-06 Relevant docs - IEC 60748-4 and IEEE P802.15.6/D03