International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Dispositifs à semiconducteurs

 

Détail

Comité
Groupes de Travail
Chef de Projet

Statut

Courant

Frcst Pub
Date

Date

Stabilité

TC 4702Jim LynchNADIS2013-112017

Historique

Stage
Document
Downloads
Date de Décision
Date Cible
PNW
47/2080/NP pdf file 393 kB
2010-11-12 
ANW
47/2109/RVN pdf file 170 kB
47/2109A/RVN pdf file 190 kB
2011-09-16 
1CD
47/2123/CD pdf file 389 kB
2012-03-022012-02-28
CDM
47/2149/CC doc file 214 kB
pdf file 196 kB
47/2149A/CC doc file 231 kB
pdf file 231 kB
2012-10-02 
ACDV
47/2149/CC doc file 214 kB
pdf file 196 kB
47/2149A/CC doc file 231 kB
pdf file 231 kB
2012-12-172012-11-30
CCDV
47/2155/CDV pdf file 319 kB
pdf file 623 kB
2013-03-062013-03-31
NADIS
47/2175/RVC doc file 199 kB
pdf file 97 kB
2013-06-252013-09-15
CDVM
 2013-10-15
ACDV
 2013-11-30

Projet

IEC 60749-28 Ed. 1.0

CEI 60749-28 Ed.1: Dispositifs à semiconducteurs - Méthodes d'essai mécaniques et climatiques - Partie 28: Essai de sensibilité aux décharges électrostatiques (DES) Modèle de dispositif chargé par contact direct (DC-CDM)

 

Remarque:

SMB/5347/DL - CCDV: 2014-11-30. Function concerned - Environment Project plan - CDV: 2013-02, FDIS: 2014-02 Relationship of project: This project may involve co-operation with JEDEC/EIA, ESDA and JEITA Liaison organizations: JEDEC/EIA, ESDA and JEITA Need for coordination within ISO or IEC: This project will be progressed with the full and active collaboration of TC101 WG6 Originally released as 60749-28 f1 Ed.1