International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 107

Process management for avionics

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 1072J. VannPPUB2012-092016

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
107/125/NP  
2010-06-04 
ANW
107/142/RVN  
107/142A/RVN  
2011-01-212010-10-31
CDTS
107/167/DTS  
2011-12-092011-10-31
APUB
107/184/RVC  
2012-06-222012-06-15
DEC
2012-06-272012-09-30
BPUB
2012-07-092012-07-15
PPUB
2012-09-182012-11-15

Project

IEC/TS 62686-1 Ed. 1.0

Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors

 

Remark:

- Project plan: DTS 2012-09 - To be considered: STACK S/0001 revision 14: JESD47, Stress Test Driven Qualification of Integrated Circuits and other JEDEC test methods; AEC Q100 Stress Test Qualification for Integrated Microcircuits; AEC Q101 Stress Test Qualification for Semiconductors