International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 56

Dependability

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 56PT 2.2Valter LOLLPPUB2007-122016

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
56/803/NP pdf file 390 kB
2002-06-28 
ANW
56/847/RVN pdf file 178 kB
2003-01-172002-11-15
1CD
56/951/CD pdf file 379 kB
2004-04-232004-01-31
CDM
56/986/CC pdf file 271 kB
56/986A/CC doc file 336 kB
pdf file 241 kB
2004-08-062004-08-31
A2CD
56/986/CC pdf file 271 kB
56/986A/CC doc file 336 kB
pdf file 241 kB
2004-11-192004-09-30
2CD
56/1040/CD pdf file 378 kB
2005-06-032005-01-31
CDM
56/1067/CC doc file 417 kB
pdf file 214 kB
56/1067A/CC doc file 453 kB
pdf file 217 kB
2005-09-162005-10-15
ACDV
56/1067/CC doc file 417 kB
pdf file 214 kB
56/1067A/CC doc file 453 kB
pdf file 217 kB
2006-02-172005-10-31
CCDV
56/1100/CDV pdf file 419 kB
2006-02-242006-02-28
ADIS
56/1134/RVC pdf file 29 kB
56/1134A/RVC doc file 902 kB
pdf file 499 kB
2006-08-112006-10-31
ADIS
56/1134/RVC pdf file 29 kB
56/1134A/RVC doc file 902 kB
pdf file 499 kB
2007-01-05 
DEC
2007-06-272007-01-31
RDIS
2007-07-112007-07-15
CDIS
56/1232/FDIS

2007-08-312007-09-30
APUB
56/1249/RVD pdf file 153 kB
2007-11-052007-10-31
BPUB
2007-11-062007-11-30
PPUB
2007-11-302008-01-31

Project

IEC 62429 Ed. 1.0

Reliability growth - Stress testing for early failures in unique complex systems

 

Remark:

- Targets: CCDV: 2005-01, CDIS 2005-09 - This PR replaces PWI 56-14-2 - Formerly IEC 61163-3 Ed 1.0 - SMB approved CCDV target date 2006-01-31 (See SMB/3206/DL)

 

Associated Documents:

SMB/3206/DL

56/1133/INF

56/1544/RM