International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 4702James LynchPPUB2006-092016

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1595/PAS pdf file 49 kB
2001-11-23 
ANW
47/1608/RVD pdf file 71 kB
2002-02-012002-04-15
1CD
47/1797/CD pdf file 237 kB
2004-12-102004-02-28
ACDV
47/1833/CC pdf file 185 kB
2005-08-052005-05-31
CCDV
47/1834/CDV pdf file 276 kB
pdf file 285 kB
47/1834F/CDV pdf file 285 kB
2005-08-192005-08-31
CCDV
47/1834/CDV pdf file 276 kB
pdf file 285 kB
47/1834F/CDV pdf file 285 kB
2005-10-07 
ADIS
47/1854/RVC pdf file 162 kB
2006-02-172006-04-30
DEC
2006-02-222006-02-28
RDIS
2006-02-222006-03-15
CDIS
47/1860/FDIS

2006-03-312006-05-31
APUB
47/1872/RVD pdf file 150 kB
2006-06-052006-07-31
BPUB
2006-06-062006-08-31
PPUB
2006-07-242006-09-30

Project

IEC 60749-39 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

 

Remark:

- formerly IEC/PAS 62307: 47/1595/PAS, 47/1608/RVD (JESD22-A120) - Formerly IEC 62307 now IEC 60749-39 - Attn: The devpt time of the PR should start at 1CD:2004-12