International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

SC 47FWG1Prof.Sekwang PARKDEL  

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47F/38/NP  
2009-10-30 
DEL
47F/50/RVN  
2010-03-122010-03-15

Project

PNW 47F-38 Ed. 1.0

(Future IEC 62047-15): Semiconductor devices -Micro-electromechanical devices - Part 15: Test method for bond strength in PDMS/Glass chip

 

Remark:

CD: 2010-02 IS: 2012-12