International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

SC 47F02L. StühlerANW2016-12 

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47F/173/NP pdf file 174 kB
2013-09-02 
ANW
47F/184/RVN doc file 141 kB
pdf file 125 kB
2014-02-072014-01-31
1CD
 2014-07-31

Project

IEC 62047-27 Ed. 1.0

Semiconductor devices - Micro-electromechanical devices - Part 27: Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)

 

Remark:

Project plan - CDV: 2015-12, FDIS: 2016-07.