International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

SC 47F01Jae-Hyun KIM / Hak-Joo LEEPPUB2011-082015

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47F/22/NP  
2009-07-03 
ANW
47F/34/RVN  
47F/34A/RVN  
2009-10-162009-11-30
1CD
47F/48/CD  
2010-03-052010-01-31
A2CD
47F/54/CC  
47F/54A/CC  
47F/54B/CC  
2010-06-182010-07-31
ACDV
47F/54/CC  
47F/54A/CC  
47F/54B/CC  
2010-07-162010-09-30
CCDV
47F/63/CDV  
2010-08-062010-09-30
ADIS
47F/81/RVC  
2011-04-012011-04-15
DEC
2011-04-012011-04-30
RDIS
2011-04-052011-04-30
CDIS
47F/85/FDIS  
2011-05-062011-07-15
APUB
47F/94/RVD  
2011-07-132011-07-15
BPUB
2011-07-142011-07-31
PPUB
2011-07-262011-08-31

Project

IEC 62047-10 Ed. 1.0

Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials

 

Remark:

CD: 2010-01 CDV: 2010-09 FDIS: 2011-08