International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 4705H. MatsuyamaDEL  

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/2119/NP pdf file 25 kB
47/2119A/NP pdf file 948 kB
2012-01-19 
DEL
47/2137/RVN pdf file 203 kB
2012-07-262012-06-15

Project

PNW 47-2119 Ed. 1.0

Copper Stress migration Test Method

 

Remark:

Project plan - CD: 2012-12, IS: 2014-12 Relationship of project activities with other international bodies - JEDEC