International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702 WPUB  

History

Stage
Document
Downloads
Decision Date
Target Date
CDPAS
47/1464/PAS  
2000-01-28 
APUB
47/1497/RVD  
2000-04-102000-04-30
BPUB
2000-04-172000-05-30
PPUB
2000-08-222000-06-15
WPUB
47/1754/MCR  
2004-05-17 

Project

IEC/PAS 62164 Ed. 1.0

Guidelines for GAAs MMIC and FET life testing

 

Remark:

This IEC/PAS will be withdrawn on 04-05-15 by 47/1754/MCR

 

Associated Documents:

47/1754/MCR