International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702 DELPUB2004-122007

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1753/NP pdf file 240 kB
2004-03-12 
ANW
47/1791/RVN pdf file 201 kB
47/1791A/RVN pdf file 138 kB
2004-10-082004-07-31
BPUB
2004-10-082004-12-31
PPUB
2004-11-102004-12-31
DELPUB
2008-01-30 

Project

IEC/PAS 62050 Ed. 1.0

Board level drop test method of components for handheld electronic products

 

Remark:

JESD22-B11 - intended to become future IEC 60749-37 - To be issued as PAS and also IEC PR in parallel - An IEC/PR is opened as IEC 60749-37