International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 4705Hideya MATSUYAMAPPUB2010-062015

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1785/NP  
2004-09-17 
ANW
47/1815/RVN  
2005-04-292005-02-15
PWI
2006-09-152005-10-31
PNW
47/1921/NP  
2007-08-03 
ANW
47/1953/RVN  
2008-01-252007-12-31
1CD
47/1954/CD  
2008-01-252008-01-31
ACDV
47/1978/CC  
2008-07-042008-05-31
CCDV
47/1993/CDV  
47/1993F/CDV  
2008-09-262008-09-30
CCDV
47/1993/CDV  
47/1993F/CDV  
2008-10-10 
ADIS
47/2034/RVC  
2009-09-252009-05-31
DEC
2009-12-142010-02-28
RDIS
2009-12-232009-12-31
CDIS
47/2044/FDIS  
2010-02-122010-03-15
APUB
47/2054/RVD  
2010-05-102010-04-15
BPUB
2010-05-112010-04-30
PPUB
2010-05-192010-05-31

Project

IEC 62415 Ed. 1.0

Semiconductor devices - Constant current electromigration test

 

Remark:

- Targets: CDV: 2008-09 FDIS: 2009-09 - Back to PWI acc to SMB/3298B/INF; Re-start with 47/1921/NP - previous PR 62227 was at PWI stage - cc:JEDEC/EIA

 

Associated Documents:

SMB/3298B/INF