International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702James LynchDEL  

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1508/PAS
2000-05-05 
ANW
47/1540/RVD pdf file 23 kB
47/1540A/RVD pdf file 26 kB
2000-08-042000-09-30
PWI
2003-04-172002-07-31
DEL
2004-05-17 

Project

IEC 62203 Ed. 1.0

Guide for Standard Probe Pad Sizes and Layouts for Wafer-Level Electrical Testing

 

Remark:

- Formerly IEC/PAS 62203 (47/1508/PAS - EIA/JEP128) - Decision PWI taken by SMB 2003-06 - This IEC PR has been withdrawn with the IEC/PAS on 04-05-15 by 47/1754/MCR

 

Associated Documents:

47/1754/MCR