International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 47  DEL  

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1450/PAS
2000-01-21 
ANW
47/1483/RVD pdf file 28 kB
2000-04-212000-06-15
AMW
47/1627/MCR pdf file 12 kB
2002-04-122002-04-30
DEL
2002-07-012002-06-30

Project

IEC 62177 Ed. 1.0

JESD22-A110-B - Highly-accelerated temperature and humidity stress test (HAST)

 

Remark:

- Formerly IEC/PAS 47/1450/PAS - IPC/JESD22-A110-B - Proj. will be DEL on 02-06-30 - Replaced by 60749-4/Ed1