International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 4702 DEL  

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1464/PAS
2000-01-21 
ANW
47/1497/RVD pdf file 27 kB
2000-04-212000-06-15
PWI
2003-02-122002-04-30
DEL
2004-05-17 

Project

IEC 62164 Ed. 1.0

Guidelines for GaAs MMIC and FET life testing

 

Remark:

- Formerly IEC/PAS (47/1454/PAS) JEP118 - Decision PWI by SMB 2003-02-12 - This IEC PR has been withdrawn with the IEC/PAS on 04-05-15 by 47/1754/MCR

 

Associated Documents:

SMB/2486/DL

47/1754/MCR