International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702 DEL  

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1461/PAS
2000-01-21 
ANW
47/1494/RVD pdf file 28 kB
2000-04-212000-06-15
AMW
47/1680/MCR pdf file 68 kB
2003-01-102002-04-30
DEL
2003-03-15 

Project

IEC 62161 Ed. 1.0

Test method A101-B - Steady state, Temperature humidity bias life test

 

Remark:

- Formerly IEC/PAS (47/1461/PAS - EIA/JESD22-A101-B - Proj. DEL on 03-03-15 - Replaced by IEC 60749-5 Ed.1

 

Associated Documents:

47/1680/MCR