International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702Jim LYNCHPPUB2011-072015

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1972/NP  
2008-05-09 
ANW
47/1992/RVN  
2008-09-262008-09-30
1CD
47/2012/CD  
2009-03-202009-09-30
CDM
47/2032/CC  
47/2032A/CC  
2009-09-182009-07-31
ACDV
47/2032/CC  
47/2032A/CC  
2010-01-082009-11-30
CCDV
47/2052/CDV  
2010-04-162010-08-31
ADIS
47/2084/RVC  
2011-01-142010-12-31
DEC
2011-03-102011-06-30
RDIS
2011-03-172011-03-31
CDIS
47/2094/FDIS  
2011-04-222011-06-15
APUB
47/2100/RVD  
2011-06-282011-06-30
BPUB
2011-06-292011-07-15
PPUB
2011-07-132011-08-15

Project

IEC 60749-40 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge

 

Remark:

Targets - CDV: 2010-08 FDIS: 2011-05 cc: TC91/WG3