International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702Jim LYNCHPPUB 2016

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1421/NP  
1998-02-27 
ANW
47/1424/RVN  
1998-06-191998-07-15
1CD
47/1439/CD pdf file 1248 kB
1999-07-231999-11-30
ACDV
47/1523/CC pdf file 151 kB
2000-07-141999-12-31
CCDV
47/1532/CDV pdf file 117 kB
47/1532A/CDV pdf file 13 kB
2000-07-212000-07-31
ADIS
47/1561/RVC pdf file 65 kB
2001-02-232001-03-31
DEC
2001-11-012001-07-31
RDIS
2001-11-052001-11-30
CDIS
47/1602/FDIS

2002-01-182002-02-15
APUB
47/1618/RVD pdf file 107 kB
2002-03-262002-04-30
BPUB
2002-03-272002-05-31
PPUB
2002-04-122002-05-31

Project

IEC 60749-4 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

 

Remark:

- Formerly IEC/PAS 62177 (47/1450/PAS-47/1483/RVD) - Derived from Proj. No. 60749/F2/Ed.3