International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702Jim LYNCHPPUB2008-022016

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1757/NP pdf file 71 kB
2004-03-26 
ANW
47/1779/RVN pdf file 360 kB
47/1779A/RVN pdf file 238 kB
2004-09-032004-11-30
ANW
47/1779/RVN pdf file 360 kB
47/1779A/RVN pdf file 238 kB
2004-11-262004-11-30
1CD
47/1796/CD pdf file 153 kB
2004-11-262005-04-30
ACDV
47/1867/CC pdf file 163 kB
2006-05-192005-06-30
CCDV
47/1885/CDV pdf file 294 kB
pdf file 312 kB
2006-08-112006-12-31
ADIS
47/1925/RVC pdf file 273 kB
2007-09-032007-04-15
DEC
2007-09-032007-08-15
RDIS
2007-09-132007-09-30
CDIS
47/1943/FDIS

2007-10-262007-12-15
APUB
47/1951/RVD pdf file 137 kB
2008-01-142007-12-31
BPUB
2008-01-152008-01-15
PPUB
2008-02-122008-02-15

Project

IEC 60749-38 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory

 

Remark:

cc: TC 56-91-101-107 - SMB Decision 124/12(2005-11)- PR should be developed in relation with TC 107 - NEW targets CCDV: 2006-12 approved per SMB/3206/DL

 

Associated Documents:

SMB/3206/DL

SMB/3224A/INF