International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 47JWG 47/101Jim LYNCHMERGED 2017

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1462/PAS  
2000-01-21 
ANW
47/1495/RVD  
2000-04-212000-06-15
1CD
47/1658/CD  
2002-09-272002-04-30
CDM
47/1700/CC  
47/1700A/CC  
2003-04-182003-01-31
ACDV
47/1700/CC  
47/1700A/CC  
2004-02-202003-07-31
CCDV
47/1751/CDV  
2004-03-122004-03-31
CDVM
47/1795/RVC  
2004-11-262004-11-15
PWI
2005-10-172005-06-30
MERGED
  

Project

IEC 60749-28 f1 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM)

 

Remark:

- Formerly IEC/PAS 62162 - JESD22-C101 - Previous PR No former IEC 62162 - cc to TC 91, 101, 104 - SMB/2867/DL decision to put the PR pending until nxt Seoul SMB mtg and nxt mtg WG2:05-05. Then SMB/3085/INF proposes to hold. SMB/3130/DL Decision Cape Town 05-10-17 to put it to PWI. Re-start with NP/CDV ?

 

Associated Documents:

SMB/3085/INF

SMB/3099/R

SMB/3130/DL