International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702Jim LynchNADIS2013-112017

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/2080/NP pdf file 393 kB
2010-11-12 
ANW
47/2109/RVN pdf file 170 kB
47/2109A/RVN pdf file 190 kB
2011-09-16 
1CD
47/2123/CD pdf file 389 kB
2012-03-022012-02-28
CDM
47/2149/CC doc file 214 kB
pdf file 196 kB
47/2149A/CC doc file 231 kB
pdf file 231 kB
2012-10-02 
ACDV
47/2149/CC doc file 214 kB
pdf file 196 kB
47/2149A/CC doc file 231 kB
pdf file 231 kB
2012-12-172012-11-30
CCDV
47/2155/CDV pdf file 319 kB
pdf file 623 kB
2013-03-062013-03-31
NADIS
47/2175/RVC doc file 199 kB
pdf file 97 kB
2013-06-252013-09-15
CDVM
 2013-10-15
ACDV
 2013-11-30

Project

IEC 60749-28 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM)

 

Remark:

SMB/5347/DL - CCDV: 2014-11-30. Function concerned - Environment Project plan - CDV: 2013-02, FDIS: 2014-02 Relationship of project: This project may involve co-operation with JEDEC/EIA, ESDA and JEITA Liaison organizations: JEDEC/EIA, ESDA and JEITA Need for coordination within ISO or IEC: This project will be progressed with the full and active collaboration of TC101 WG6 Originally released as 60749-28 f1 Ed.1