International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4701 DEL 2010

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
1986-08-01 
ANW
1986-08-02 
1CD
1988-11-01 
3CD
47(SEC.)/1227/CD  
1991-05-31 
A4CD
   
1992-11-01 
ACDV
1994-10-28 
4CD
47/1390/CD  
1995-10-13 
DEL
1997-10-24 

Project

IEC 60749 am1 f1 Ed. 2.0

Resistance to dissolution of metallization on SMD's

 

Remark:

- TC 91/WG 3.

 

Associated Documents:

47/1387/RM

 
47/1399/CC

 
47/1406/RM

 
47/1427/RM