International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 47  WPUB 2010

History

Stage
Document
Downloads
Decision Date
Target Date
BPUB
2001-10-29 
PPUB
2002-04-102001-12-31
WPUB
47/1767/MCR pdf file 61 kB
2004-05-212004-07-31

Project

IEC 60749 Ed. 2.2

Semiconductor devices - Mechanical and climatic test methods

 

Remark:

- Withdrawn by 47/1767/MCR on 04-07-30 and replaced by 60749-xx Parts acc. to annex of MCR

 

Associated Documents:

47/1767/MCR