International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
SC 47F |
Micro-electromechanical systems |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| SC 47F | 01 | Hak-Joo LEE | PPUB | 2011-03 | 2015 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 2007-03-30 | ||||||
| ANW |
| 2007-09-28 | 2007-08-15 | |||||
| 1CD |
| 2008-02-15 | 2007-12-31 | |||||
| A2CD |
| 2008-09-19 | 2008-06-30 | |||||
| 2CD |
| 2008-12-19 | 2008-11-30 | |||||
| ACDV |
| 2009-07-31 | 2009-04-30 | |||||
| CCDV |
| 2009-08-21 | 2009-10-31 | |||||
| ADIS |
| 2010-07-23 | 2010-04-30 | |||||
| DEC | 2010-11-01 | 2010-09-30 | ||||||
| RDIS | 2010-11-10 | 2010-11-30 | ||||||
| CDIS |
| 2010-12-17 | 2011-02-15 | |||||
| APUB |
| 2011-02-22 | 2011-02-28 | |||||
| BPUB | 2011-02-23 | 2011-03-15 | ||||||
| PPUB | 2011-03-14 | 2011-04-15 | ||||||
469 kB
112 kBProject
IEC 62047-8 Ed. 1.0
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films
Remark:
- Targets: CDV: 2008-09 FDIS: 2009-09 -cc: 49, 56, 91, 101 - Transferred from TC 47/WG 4