International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

SC 47F01Hak-Joo LEEPPUB2011-032016

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1906/NP pdf file 469 kB
2007-03-30 
ANW
47/1931/RVN pdf file 146 kB
47/1931A/RVN pdf file 153 kB
2007-09-282007-08-15
1CD
47/1961/CD pdf file 437 kB
2008-02-152007-12-31
A2CD
47F/8/CC pdf file 260 kB
47F/8A/CC pdf file 259 kB
2008-09-192008-06-30
2CD
47F/12/CD pdf file 601 kB
2008-12-192008-11-30
ACDV
47F/27/CC pdf file 521 kB
2009-07-312009-04-30
CCDV
47F/30/CDV pdf file 1043 kB
pdf file 687 kB
47F/30F/CDV pdf file 687 kB
2009-08-212009-10-31
ADIS
47F/61/RVC doc file 112 kB
pdf file 210 kB
2010-07-232010-04-30
DEC
2010-11-012010-09-30
RDIS
2010-11-102010-11-30
CDIS
47F/71/FDIS

2010-12-172011-02-15
APUB
47F/77/RVD pdf file 205 kB
2011-02-222011-02-28
BPUB
2011-02-232011-03-15
PPUB
2011-03-142011-04-15

Project

IEC 62047-8 Ed. 1.0

Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films

 

Remark:

- Targets: CDV: 2008-09 FDIS: 2009-09 -cc: 49, 56, 91, 101 - Transferred from TC 47/WG 4