International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

SC 47F Kuniki OHWADAPPUB2009-042016

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1868/NP pdf file 272 kB
2006-05-26 
ANW
47/1891/RVN pdf file 140 kB
47/1891A/RVN pdf file 201 kB
2006-09-222006-10-15
ANW
47/1891/RVN pdf file 140 kB
47/1891A/RVN pdf file 201 kB
2006-12-08 
1CD
47/1900/CD pdf file 252 kB
2007-03-022007-03-31
ACDV
47/1920/CC pdf file 114 kB
2007-07-272007-07-31
CCDV
47/1945/CDV pdf file 196 kB
pdf file 219 kB
2007-11-022007-08-31
ADIS
47/1968/RVC pdf file 124 kB
47/1968A/RVC pdf file 169 kB
2008-04-252008-07-15
DEC
2008-10-202008-12-15
RDIS
2008-10-282008-11-15
CDIS
47F/15/FDIS

2009-01-162009-01-31
APUB
47F/17/RVD pdf file 27 kB
2009-03-272009-03-31
BPUB
2009-03-282009-03-31
PPUB
2009-04-072009-04-30

Project

IEC 62047-6 Ed. 1.0

Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials

 

Remark:

- Targets: CD:2007-03, CDV:2007-12, FDIS:2008-12 - cc: 47E, 56, 91, 101 - Transferred from TC 47/WG 4