International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

SC 47F01Chiemi IshiyamaPPUB2012-032016

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47F/24/NP pdf file 171 kB
2009-07-03 
ANW
47F/36/RVN pdf file 283 kB
47F/36A/RVN pdf file 273 kB
2009-10-162009-11-30
1CD
47F/44/CD pdf file 408 kB
2010-02-192010-02-28
A2CD
47F/53/CC doc file 101 kB
pdf file 210 kB
47F/53A/CC doc file 136 kB
pdf file 131 kB
47F/53B/CC pdf file 158 kB
2010-05-282010-06-30
CDM
47F/53/CC doc file 101 kB
pdf file 210 kB
47F/53A/CC doc file 136 kB
pdf file 131 kB
47F/53B/CC pdf file 158 kB
2010-09-032010-09-30
ACDV
47F/53/CC doc file 101 kB
pdf file 210 kB
47F/53A/CC doc file 136 kB
pdf file 131 kB
47F/53B/CC pdf file 158 kB
2010-12-172010-11-30
CCDV
47F/72/CDV pdf file 298 kB
2010-12-242010-12-31
ADIS
47F/98/RVC doc file 133 kB
pdf file 161 kB
2011-08-052011-08-31
DEC
2011-10-042011-09-30
RDIS
2011-10-072011-10-31
CDIS
47F/109/FDIS

2011-12-012012-01-15
APUB
47F/119/RVD pdf file 95 kB
2012-02-062012-02-15
BPUB
2012-02-072012-02-29
PPUB
2012-02-282012-03-31

Project

IEC 62047-13 Ed. 1.0

Semiconductor devices - Micro-electromechanical devices - Part 13: Bend - and shear - type test methods of measuring adhesive strength for MEMS structures

 

Remark:

CDV: 2010-09 FDIS: 2011-08