International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
SC 47E |
Discrete semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| SC 47E | 03 | M. Takeuchi | PPUB | 2013 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 2000-03-31 | ||||
| ANW |
| 2000-10-27 | 2000-08-15 | |||
| 1CD |
| 2001-07-27 | 2000-12-31 | |||
| ACDV |
| 2002-01-04 | 2001-11-30 | |||
| CCDV |
| 2002-12-20 | 2002-06-30 | |||
| ADIS |
| 2003-08-01 | 2003-08-31 | |||
| DEC | 2004-03-23 | 2004-01-31 | ||||
| RDIS | 2004-03-26 | 2004-04-15 | ||||
| CDIS |
| 2004-05-28 | 2004-06-30 | |||
| APUB |
| 2004-08-09 | 2004-09-30 | |||
| BPUB | 2004-08-10 | 2004-10-31 | ||||
| PPUB | 2004-09-24 | 2004-11-30 | ||||
363 kBProject
IEC 60747-8-4 Ed. 1.0
Discrete semiconductor devices - Part 8-4: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for power switching applications
Remark:
- The publication will be withdrawn on 2013-12-31 - TC 22, Mr. Lips - Previous PR No: IEC 60747-8-12 - This PPUB will be withdrawn when IEC 60747-8/Ed3 will be published.