International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 56

Dependability

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 56PT 2.17Jens BRABANDPPUB2006-062018

History

Stage
Document
Downloads
Decision Date
Target Date
AMW
56/831/MCR pdf file 64 kB
2002-11-29 
1CD
56/865/CD pdf file 306 kB
2003-06-202003-06-30
A2CD
56/938/CC pdf file 425 kB
2004-02-062004-01-31
2CD
56/956/CD pdf file 252 kB
56/956A/CD pdf file 252 kB
2004-04-302004-05-31
2CD
56/956/CD pdf file 252 kB
56/956A/CD pdf file 252 kB
2004-05-28 
CDM
56/990/CC pdf file 412 kB
56/990A/CC doc file 399 kB
pdf file 324 kB
2004-08-062004-08-31
ACDV
56/990/CC pdf file 412 kB
56/990A/CC doc file 399 kB
pdf file 324 kB
2004-11-192004-09-30
CCDV
56/1026/CDV pdf file 384 kB
pdf file 394 kB
2005-02-042005-01-31
CDVM
56/1049/RVC doc file 755 kB
pdf file 345 kB
56/1049A/RVC doc file 840 kB
pdf file 362 kB
2005-08-052005-10-15
ADIS
56/1049/RVC doc file 755 kB
pdf file 345 kB
56/1049A/RVC doc file 840 kB
pdf file 362 kB
2005-11-042005-10-31
DEC
2005-11-292005-12-31
RDIS
2005-11-302006-01-15
CDIS
56/1096/FDIS

2006-02-102006-03-31
APUB
56/1111/RVD pdf file 207 kB
2006-04-192006-06-30
BPUB
2006-04-202006-07-31
PPUB
2006-05-182006-08-31

Project

IEC 61165 Ed. 2.0

Application of Markov techniques

 

Remark:

- also of interest to TC65 and SC65A

 

Associated Documents:

56/837/DC

56/1342/INF

56/1354/MCR

56/1414/DC

56/1425/INF

56/1425A/INF

56/1493/RM