International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 56

Dependability

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 56WG02Valter LOLLPPUB2006-072018

History

Stage
Document
Downloads
Decision Date
Target Date
AMW
56/788/MCR pdf file 53 kB
2002-01-11 
1CD
56/845/CD pdf file 1866 kB
2003-01-172003-01-31
ACDV
56/908/CC pdf file 108 kB
2003-10-172003-05-31
CCDV
56/914/CDV pdf file 2200 kB
pdf file 2233 kB
2003-11-212003-10-31
CDVM
56/957/RVC pdf file 113 kB
56/957A/RVC doc file 163 kB
pdf file 127 kB
2004-05-072004-07-31
ADIS
56/957/RVC pdf file 113 kB
56/957A/RVC doc file 163 kB
pdf file 127 kB
2004-11-192004-09-30
DEC
2006-01-052005-10-31
RDIS
2006-01-112006-01-31
CDIS
56/1102/FDIS

2006-03-102006-04-15
APUB
56/1118/RVD pdf file 252 kB
2006-05-172006-07-15
BPUB
2006-05-182006-08-15
PPUB
2006-06-262006-09-15

Project

IEC 61163-1 Ed. 2.0

Reliability stress screening - Part 1: Repairable assemblies manufactured in lots

 

Remark:

- Targets: CCDV 2004-12

 

Associated Documents:

SMB/3130/DL

56/1493/RM