International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | PT 62258 | Jim Wolbert | PPUB | 2007-11 | 2015 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| 1CD |
| 2006-02-17 | ||||
| ACDV |
| 2006-06-09 | 2006-06-30 | |||
| CDTR |
| 2006-08-25 | 2006-08-31 | |||
| APUB |
| 2007-01-19 | 2007-02-28 | |||
| BPUB | 2007-01-20 | 2007-08-31 | ||||
| DEC | 2007-07-13 | 2007-06-30 | ||||
| PPUB | 2007-08-23 | 2007-10-31 | ||||
210 kBProject
IEC/TR 62258-7 Ed. 1.0
Semiconductor die products - Part 7: XML schema for data exchange
Remark:
- Liaison with DPC, JEDEC, BSI and cc: IEC/TC 40, 56, 101 - Based on 47/1519/NP, this PR is developed under the same series - There will be no FR for this series, UTE 2004-11-02 - Exceptionally this PR is in //V CEN