International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | Nick Lycoudes | PPUB | 2006-09 | 2012 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 2005-10-21 | ||||
| ANW |
| 2006-06-30 | 2006-03-15 | |||
| BPUB | 2006-07-03 | 2006-06-30 | ||||
| PPUB | 2006-09-12 | 2006-09-30 | ||||
1872 kBProject
IEC/PAS 62483 Ed. 1.0
Test method for measuring whisker growth on tin and tin alloy surface finishes
Remark:
- To confirm IEC/PR No - 60749-xx ?? ex-JEDEC JESD22A121 - Targets IEC/PR: 1CD: 2006-10 IS: 2009-12 - cc TC 56, 91, 101