International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702Nick LycoudesDELPUB2006-092013

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1842/NP pdf file 1872 kB
2005-10-21 
ANW
47/1876/RVN pdf file 308 kB
2006-06-302006-03-15
BPUB
2006-07-032006-06-30
PPUB
2006-09-122006-09-30
DELPUB
2013-09-25 

Project

IEC/PAS 62483 Ed. 1.0

Test method for measuring whisker growth on tin and tin alloy surface finishes

 

Remark:

- To confirm IEC/PR No - 60749-xx ?? ex-JEDEC JESD22A121 - Targets IEC/PR: 1CD: 2006-10 IS: 2009-12 - cc TC 56, 91, 101