International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 4702 PPUB 2016

History

Stage
Document
Downloads
Decision Date
Target Date
CDPAS
47/1462/PAS
2000-01-28 
APUB
47/1495/RVD pdf file 28 kB
2000-04-102000-04-30
BPUB
2000-04-172000-05-30
PPUB
2000-08-222000-06-15

Project

IEC/PAS 62162 Ed. 1.0

Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components

 

Remark:

- MRD extended with Toulouse mtg, 2007-11 - Intended to become IEC 60749-28