International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 4702Dr J. LynchPPUB2013-102016

History

Stage
Document
Downloads
Decision Date
Target Date
PWI
2006-06-30 
PNW
47/2121/NP  
2012-03-20 
CCDV
47/2122/CDV  
2012-03-21 
ANW
47/2138/RVN  
47/2138A/RVN  
2012-07-262012-08-15
ADIS
47/2156/RVC  
2012-12-182012-11-30
DEC
2013-05-022013-03-31
RDIS
2013-05-162013-05-31
CDIS
47/2171/FDIS  
2013-06-122013-08-15
APUB
47/2180/RVD  
2013-09-042013-08-15
BPUB
2013-09-052013-08-31
PPUB
2013-09-252013-09-30

Project

IEC 62483 Ed. 1.0

Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices

 

Remark:

Functions concerned - Safety and Quality assurance Project plan - FDIS: 2013-03 This project may involve co-operation with JEDEC Need for coordination within IEC TC91/WG3 Ex-IEC/PAS 62483 (JESD22A121)

 

Associated Documents:

47/1842/NP

 
47/1876/RVN