International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 05 | Nobuyuki WAKAI | PPUB | 2010-10 | 2015 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 2006-09-29 | ||||||
| ANW |
| 2007-08-31 | 2007-02-15 | |||||
| 1CD |
| 2007-11-02 | 2007-12-31 | |||||
| ACDV |
| 2008-09-26 | 2008-03-31 | |||||
| CCDV |
| 2008-10-17 | 2008-10-31 | |||||
| ADIS |
| 2010-02-12 | 2010-06-30 | |||||
| DEC | 2010-05-14 | 2010-06-30 | ||||||
| RDIS | 2010-05-25 | 2010-05-31 | ||||||
| CDIS |
| 2010-06-18 | 2010-08-15 | |||||
| APUB |
| 2010-09-06 | 2010-08-31 | |||||
| BPUB | 2010-09-07 | 2010-09-15 | ||||||
| PPUB | 2010-09-29 | 2010-10-15 | ||||||
461 kB
135 kBProject
IEC 62374-1 Ed. 1.0
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Remark:
- RDIS: 2010-06-30 PPUB: 2010-10-31 (see SMB/4204/DL) - Proposed target: FDIS: 2010-06 IS: 2010-10 - cc: TC 56, 91, 101 - Targets CDV: 2008-09 FDIS: 2009-09
Associated Documents:
SMB/4204/DL