International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 05 | Jaap BISSCHOP | PPUB | 2007-01 | 2014 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 2002-02-22 | ||||||
| ANW |
| 2003-04-18 | 2002-07-15 | |||||
| 1CD |
| 2004-04-30 | 2004-05-31 | |||||
| CDM |
| 2004-09-03 | 2004-08-31 | |||||
| ACDV |
| 2005-02-04 | 2004-11-30 | |||||
| CCDV |
| 2005-07-01 | 2005-02-28 | |||||
| ADIS |
| 2006-05-12 | 2006-03-15 | |||||
| DEC | 2006-07-11 | 2006-07-15 | ||||||
| RDIS | 2006-07-18 | 2006-08-15 | ||||||
| CDIS |
| 2006-10-27 | 2006-10-31 | |||||
| APUB |
| 2007-01-16 | 2007-01-31 | |||||
| BPUB | 2007-01-17 | 2007-02-28 | ||||||
| PPUB | 2007-03-29 | 2007-03-31 | ||||||
41 kBProject
IEC 62374 Ed. 1.0
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Remark:
- Target 1CD: 2004-05, CCDV: 2004-12, CDIS 2005-05 - FR will come at FDIS level acc. to Mrs Delort e-mail 05-03-07