International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 05 | Jaap BISSCHOP | PPUB | 2006-09 | 2014 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 2002-02-22 | ||||||
| ANW |
| 2003-04-18 | 2002-07-15 | |||||
| 1CD |
| 2004-04-30 | 2004-05-31 | |||||
| CDM |
| 2004-09-03 | 2004-08-31 | |||||
| ACDV |
| 2005-02-04 | 2004-11-30 | |||||
| CCDV |
| 2005-03-18 | 2005-02-28 | |||||
| ADIS |
| 2005-10-28 | 2005-11-30 | |||||
| DEC | 2006-01-27 | 2006-03-31 | ||||||
| RDIS | 2006-02-13 | 2006-02-28 | ||||||
| CDIS |
| 2006-04-07 | 2006-05-15 | |||||
| APUB |
| 2006-06-12 | 2006-07-31 | |||||
| BPUB | 2006-06-13 | 2006-08-31 | ||||||
| PPUB | 2006-07-18 | 2006-09-30 | ||||||
38 kBProject
IEC 62373 Ed. 1.0
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Remark:
- Target 1CD: 2004-05, CCDV: 2004-12, CDIS 2005-05 - FR will come at FDIS level accr to Mme Delort email 2005-03-07 - MRD revised as per decision in London mtg, 2006-10