International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702Jim LYNCHPPUB2011-072015

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1972/NP pdf file 799 kB
2008-05-09 
ANW
47/1992/RVN pdf file 120 kB
2008-09-262008-09-30
1CD
47/2012/CD pdf file 452 kB
2009-03-202009-09-30
CDM
47/2032/CC doc file 169 kB
pdf file 502 kB
47/2032A/CC pdf file 245 kB
2009-09-182009-07-31
ACDV
47/2032/CC doc file 169 kB
pdf file 502 kB
47/2032A/CC pdf file 245 kB
2010-01-082009-11-30
CCDV
47/2052/CDV pdf file 641 kB
pdf file 594 kB
2010-04-162010-08-31
ADIS
47/2084/RVC pdf file 222 kB
2011-01-142010-12-31
DEC
2011-03-102011-06-30
RDIS
2011-03-172011-03-31
CDIS
47/2094/FDIS

2011-04-222011-06-15
APUB
47/2100/RVD pdf file 49 kB
2011-06-282011-06-30
BPUB
2011-06-292011-07-15
PPUB
2011-07-132011-08-15

Project

IEC 60749-40 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge

 

Remark:

Targets - CDV: 2010-08 FDIS: 2011-05 cc: TC91/WG3