International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | James Lynch | PPUB | 2006-09 | 2016 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 2001-11-23 | ||||||
| ANW |
| 2002-02-01 | 2002-04-15 | |||||
| 1CD |
| 2004-12-10 | 2004-02-28 | |||||
| ACDV |
| 2005-08-05 | 2005-05-31 | |||||
| CCDV |
| 2005-08-19 | 2005-08-31 | |||||
| CCDV |
| 2005-10-07 | ||||||
| ADIS |
| 2006-02-17 | 2006-04-30 | |||||
| DEC | 2006-02-22 | 2006-02-28 | ||||||
| RDIS | 2006-02-22 | 2006-03-15 | ||||||
| CDIS |
| 2006-03-31 | 2006-05-31 | |||||
| APUB |
| 2006-06-05 | 2006-07-31 | |||||
| BPUB | 2006-06-06 | 2006-08-31 | ||||||
| PPUB | 2006-07-24 | 2006-09-30 | ||||||
49 kBProject
IEC 60749-39 Ed. 1.0
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
Remark:
- formerly IEC/PAS 62307: 47/1595/PAS, 47/1608/RVD (JESD22-A120) - Formerly IEC 62307 now IEC 60749-39 - Attn: The devpt time of the PR should start at 1CD:2004-12