International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | Jim LYNCH | PPUB | 2008-02 | 2016 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 2004-03-26 | ||||||
| ANW |
| 2004-09-03 | 2004-11-30 | |||||
| ANW |
| 2004-11-26 | 2004-11-30 | |||||
| 1CD |
| 2004-11-26 | 2005-04-30 | |||||
| ACDV |
| 2006-05-19 | 2005-06-30 | |||||
| CCDV |
| 2006-08-11 | 2006-12-31 | |||||
| ADIS |
| 2007-09-03 | 2007-04-15 | |||||
| DEC | 2007-09-03 | 2007-08-15 | ||||||
| RDIS | 2007-09-13 | 2007-09-30 | ||||||
| CDIS |
| 2007-10-26 | 2007-12-15 | |||||
| APUB |
| 2008-01-14 | 2007-12-31 | |||||
| BPUB | 2008-01-15 | 2008-01-15 | ||||||
| PPUB | 2008-02-12 | 2008-02-15 | ||||||
71 kBProject
IEC 60749-38 Ed. 1.0
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Remark:
cc: TC 56-91-101-107 - SMB Decision 124/12(2005-11)- PR should be developed in relation with TC 107 - NEW targets CCDV: 2006-12 approved per SMB/3206/DL
Associated Documents:
SMB/3206/DL
SMB/3224A/INF