International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 4702Jim LYNCHPPUB2008-022016

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/1757/NP  
2004-03-26 
ANW
47/1779/RVN  
47/1779A/RVN  
2004-09-032004-11-30
ANW
47/1779/RVN  
47/1779A/RVN  
2004-11-262004-11-30
1CD
47/1796/CD  
2004-11-262005-04-30
ACDV
47/1867/CC  
2006-05-192005-06-30
CCDV
47/1885/CDV  
2006-08-112006-12-31
ADIS
47/1925/RVC  
2007-09-032007-04-15
DEC
2007-09-032007-08-15
RDIS
2007-09-132007-09-30
CDIS
47/1943/FDIS  
2007-10-262007-12-15
APUB
47/1951/RVD  
2008-01-142007-12-31
BPUB
2008-01-152008-01-15
PPUB
2008-02-122008-02-15

Project

IEC 60749-38 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory

 

Remark:

cc: TC 56-91-101-107 - SMB Decision 124/12(2005-11)- PR should be developed in relation with TC 107 - NEW targets CCDV: 2006-12 approved per SMB/3206/DL

 

Associated Documents:

SMB/3206/DL

SMB/3224A/INF