International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | Jim Lynch | PPUB | 2011-04 | 2015 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| AMW |
| 2009-01-09 | ||||||
| CCDV |
| 2009-09-04 | 2009-06-30 | |||||
| ADIS |
| 2010-08-27 | 2010-05-15 | |||||
| DEC | 2010-12-03 | 2010-12-31 | ||||||
| RDIS | 2010-12-14 | 2010-12-31 | ||||||
| CDIS |
| 2011-01-14 | 2011-03-15 | |||||
| APUB |
| 2011-03-21 | 2011-03-15 | |||||
| BPUB | 2011-03-22 | 2011-03-31 | ||||||
| PPUB | 2011-04-07 | 2011-04-30 | ||||||
9 kB
171 kBProject
IEC 60749-29 Ed. 2.0
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Remark: