International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | JWG 47/101 | H.E. Rundqvist | PPUB | 2006-08 | 2017 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| AMW |
| 2005-01-14 | ||||||
| CCDV |
| 2005-01-15 | 2005-01-31 | |||||
| CCDV |
| 2005-03-11 | 2005-01-31 | |||||
| CDVM |
| 2005-07-15 | 2005-09-15 | |||||
| ADIS |
| 2006-02-03 | 2005-09-30 | |||||
| DEC | 2006-02-10 | 2006-02-15 | ||||||
| RDIS | 2006-02-13 | 2006-02-28 | ||||||
| CDIS |
| 2006-03-31 | 2006-05-15 | |||||
| APUB |
| 2006-06-05 | 2006-07-15 | |||||
| BPUB | 2006-06-06 | 2006-08-15 | ||||||
| PPUB | 2006-07-18 | 2006-09-15 | ||||||
79 kBProject
IEC 60749-27 Ed. 2.0
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Remark:
Targets: CDIS 2006-01 cc: TC 91, 101, 104