International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702Jim LynchPPUB2010-112015

History

Stage
Document
Downloads
Decision Date
Target Date
AMW
47/2009/MCR pdf file 9 kB
47/2009A/MCR pdf file 217 kB
2009-01-09 
CCDV
47/2014/CDV pdf file 101 kB
pdf file 107 kB
2009-04-242009-06-30
ADIS
47/2040/RVC pdf file 214 kB
2009-12-182009-12-31
DEC
2010-07-092010-02-28
RDIS
2010-07-142010-07-31
CDIS
47/2067/FDIS

2010-08-132010-10-15
APUB
47/2078/RVD pdf file 206 kB
2010-10-182010-10-15
BPUB
2010-10-192010-10-31
PPUB
2010-10-282010-11-30

Project

IEC 60749-15 Ed. 2.0

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices

 

Remark:

cc: TC 91, 104