International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

SC 47F01Dr.Yakichi HigoPPUB2013-072017

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47F/47/NP pdf file 334 kB
2010-02-26 
ANW
47F/57/RVN doc file 141 kB
pdf file 256 kB
47F/57A/RVN pdf file 369 kB
2010-06-252010-07-15
1CD
47F/76/CD pdf file 386 kB
2011-02-182010-11-30
CDM
47F/102/CC doc file 147 kB
pdf file 176 kB
47F/102A/CC doc file 207 kB
pdf file 203 kB
2011-09-08 
ACDV
47F/102/CC doc file 147 kB
pdf file 176 kB
47F/102A/CC doc file 207 kB
pdf file 203 kB
2011-12-022011-11-30
CCDV
47F/120/CDV pdf file 517 kB
pdf file 493 kB
2012-02-292012-03-31
ADIS
47F/142/RVC doc file 101 kB
pdf file 122 kB
2012-11-222012-10-31
DEC
2013-02-192013-01-31
RDIS
2013-02-212013-03-15
CDIS
47F/155/FDIS

2013-04-242013-05-31
APUB
47F/162/RVD pdf file 46 kB
2013-07-012013-06-30
BPUB
2013-07-022013-07-15
PPUB
2013-07-172013-08-15

Project

IEC 62047-18 Ed. 1.0

Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials

 

Remark:

Project plan: CDV: 2011-10 FDIS: 2012-09 IS: 2013-02