International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
SC 47E |
Discrete semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| SC 47E | 01 | Sangsik PARK | DEL |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 2007-05-11 | ||||
| DEL |
| 2007-10-05 | 2007-09-30 | |||
570 kBProject
PNW 47E-328 Ed. 1.0
Semiconductor devices - Discrete devices - Part 14-x: Semiconductor sensors - Test method of CMOS image sensor module
Remark:
- Intended to become IEC 60747-14-x - cc:TC 47