International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
SC 47E |
Discrete semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| SC 47E | MERGED |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW | 1988-02-01 | |||||
| ANW | 1989-10-06 | |||||
| 1CD | 1990-11-07 | |||||
| CCDV |
| 1993-04-23 | ||||
| ADIS | 1994-01-07 | |||||
| MERGED | 1996-02-16 | |||||
Project
IEC 60747-6 am3 f1 Ed. 1.0
Revision of Clause 2, Thermal measurements of IEC 747-6, Chapter IV
Remark:
- Transferred from TC 47. - Former 47.6.18.A.