International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
SC 47E |
Discrete semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| SC 47E | 01 | Sekwang PARK | PPUB | 2010-02 | 2015 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 2005-12-02 | ||||||
| ANW |
| 2006-07-21 | 2006-04-30 | |||||
| 1CD |
| 2007-04-13 | 2006-11-30 | |||||
| CDM |
| 2007-10-05 | 2007-11-15 | |||||
| A2CD |
| 2007-12-21 | 2007-12-31 | |||||
| 2CD |
| 2007-12-21 | 2008-01-31 | |||||
| ACDV |
| 2008-08-01 | 2008-04-30 | |||||
| CCDV |
| 2008-09-26 | 2008-09-30 | |||||
| ADIS |
| 2009-09-18 | 2009-05-31 | |||||
| DEC | 2009-09-18 | 2009-11-30 | ||||||
| RDIS | 2009-09-28 | 2009-10-15 | ||||||
| CDIS |
| 2009-11-13 | 2009-12-31 | |||||
| APUB |
| 2010-01-22 | 2010-01-15 | |||||
| BPUB | 2010-01-23 | 2010-01-31 | ||||||
| PPUB | 2010-02-11 | 2010-02-28 | ||||||
357 kBProject
IEC 60747-14-5 Ed. 1.0
Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
Remark:
- cc: IEC TC 22, 104