International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 107 |
Process management for avionics |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 107 | 2 | J. Vann | PPUB | 2012-09 | 2016 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 2010-06-04 | ||||||
| ANW |
| 2011-01-21 | 2010-10-31 | |||||
| CDTS |
| 2011-12-09 | 2011-10-31 | |||||
| APUB |
| 2012-06-22 | 2012-06-15 | |||||
| DEC | 2012-06-27 | 2012-09-30 | ||||||
| BPUB | 2012-07-09 | 2012-07-15 | ||||||
| PPUB | 2012-09-18 | 2012-11-15 | ||||||
777 kBProject
IEC/TS 62686-1 Ed. 1.0
Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications - Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
Remark:
- Project plan: DTS 2012-09 - To be considered: STACK S/0001 revision 14: JESD47, Stress Test Driven Qualification of Integrated Circuits and other JEDEC test methods; AEC Q100 Stress Test Qualification for Integrated Microcircuits; AEC Q101 Stress Test Qualification for Semiconductors