International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 107

Process management for avionics

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 107WG2J. VannDELPUB2009-052012

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
107/67/NP  
2007-02-16 
ANW
107/77/RVN  
107/77A/RVN  
2007-12-072007-07-15
CDTS
107/91/DTS  
2008-07-252008-06-30
APUB
107/100/RVC  
107/100A/RVC  
2008-12-192009-01-31
DEC
2009-02-182009-02-28
BPUB
2009-03-092009-03-15
PPUB
2009-05-132009-07-15
DELPUB
2011-08-30 

Project

IEC/TS 62564-1 Ed. 1.0

Aerospace qualified electronic component (AQEC) - Part 1: Microcircuits

 

Remark:

- Of interest to TC 47, 91 - To be considered: GEIA specification GEIA-STD-0002-1 Aerospace Qualified Electronic Component (AQEC) Requirements, Volume 1 - Integrated Circuits and Semiconductors, JESD47 Stress Test Driven Qualification of Integrated Circuits and other JEDEC test methods; ES59002 General requirements for Integrated Circuits and Discrete Semiconductors; TS16949 Semiconductor supplement AEC-Q100 - Stress Test Qualification for Integrated Microcircuits.