International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 107 |
Process management for avionics |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 107 | WG2 | J. Vann | DELPUB | 2009-05 | 2012 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 2007-02-16 | ||||||
| ANW |
| 2007-12-07 | 2007-07-15 | |||||
| CDTS |
| 2008-07-25 | 2008-06-30 | |||||
| APUB |
| 2008-12-19 | 2009-01-31 | |||||
| DEC | 2009-02-18 | 2009-02-28 | ||||||
| BPUB | 2009-03-09 | 2009-03-15 | ||||||
| PPUB | 2009-05-13 | 2009-07-15 | ||||||
| DELPUB | 2011-08-30 | |||||||
222 kB
237 kBProject
IEC/TS 62564-1 Ed. 1.0
Aerospace qualified electronic component (AQEC) - Part 1: Microcircuits
Remark:
- Of interest to TC 47, 91 - To be considered: GEIA specification GEIA-STD-0002-1 Aerospace Qualified Electronic Component (AQEC) Requirements, Volume 1 - Integrated Circuits and Semiconductors, JESD47 Stress Test Driven Qualification of Integrated Circuits and other JEDEC test methods; ES59002 General requirements for Integrated Circuits and Discrete Semiconductors; TS16949 Semiconductor supplement AEC-Q100 - Stress Test Qualification for Integrated Microcircuits.